FAMILY OF MEASURING SENSORS

ONLINE MEASUREMENT NEWS

Information

SENSOR FAMILY

The choice of a family of measuring sensors depends on parameters such as:

  • Customer needs
  • Material  attributes
  • Measurement accuracy
  • Measurement ranges
  • Material widths

Depending on these parameters, SCANTECH identifies the most customized sensor(s) for each case. With our terminology, a sensor is not defined by a specific technology and is not either a juxtaposition of technologies. It is instead a combination of technologies which are suitable for a given range of applications.

Nevertheless, in most cases SCANTECH employs the following technologies:

  • X-ray transmission
  • X-ray scattering
  • X-ray fluorescence
  • Infrared transmission
  • Infrared scattering
  • Laser triangulation
  • Laser shadowing
  • Eddy currents
  • Microwave transmission
  • Optical imaging

Although very simple to implement, SCANTECH has always rejected the use of radioactive sources, particularly the well-known beta sources.

 X-RAYS

Scantech is a leader in X-ray technology. Produced by electrical devices, such as Infrared or UV light, X-rays are linked to the electron transitions of atoms and are therefore sensitive to the atomic composition of materials. However, SCANTECH provides solutions, which can be almost insensitive to the material compositions.

The X-raysBeneficial properties include:

  • Extremely wide measuring ranges
  • The highest accuracy among all other on-line sensors
  • Exceptional streat resolution and fast response time
  • The ability to measure composition or even specific layers
  • The ability to be
  • Long life span, typically 10 years, and low replacement costs.

 

Like other absorption methods (IR, Beta…)) the main limitation is their dependence on the density which makes an error proportional to the density variations when the measured parameter is the thickness.

INFRARED

Infra-red waves  exit the low energy levels of molecules (vibration modes). They are therefore extremely sensitive to the molecular composition and not suitable for measuring global properties of materials such as the total thickness or basis weight. HoweverHowever, conversely, this sensitivity, can be used to target specific components, the most common cases being water, or specific polymers. That’s why IR can be advantageously used for measuring material moisture or barrier layers.

EDDY CURRENT

Most sensors are sensitive to their relative distance with the measured material or to the distance between the emitter and receiver. Eddy current sensors solve this particular challenge.

LASER TRIANGULATION AND SHADOWING

In both cases,  laser beams are used to directly measure a distance. Well implemented, laser sensors can measure a thickness without being affected by the material composition and density.

MICROWAVES

Microwave sensors are mainly used for measuring the moisture of heavy materials when Infra-red is no more suitable.

OPTICAL IMAGING

Optical imaging is the main technology for surface inspection. It allows the detection of visual defects of transparent or opaque materials. Combining dimensional and visual aspect measurements is highly practical. Indeed, they both allow the signature of the material quality to be complete. They also quantify the performance of the production process.

 

Contact us in order to choose the family of measurement sensors best suited to your manufacturing process.